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   y vs. x
Dataset
Name:
Thurber

Procedure: Nonlinear Least Squares Regression
Certification Method & Definitions

Data: 1 Response Variable (y)
1 Predictor Variable (x)
37 Observations
Higher Level of Difficulty
Observed Data
Data file (ASCII Format)
Additional Information

Model: Rational Class
7 Parameters (beta(1) to beta(7) to beta(1) to beta(7))
Starting Values

y = f(x;beta) + e = (beta(1) + beta(2)x + beta(3)x^2 + beta(4)x^2) / (1 + beta(5)x + beta(6)x^2 + beta(7)x^3) + e

Results: Certified Values
Graphics

Reference: Thurber, R., NIST (1979).
Semiconductor electron mobility modeling.