5.
Process Improvement
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Chapter specific references |
Bisgaard, S. and
Steinberg, D. M., (1997), "The Design and Analysis of 2k-p
Prototype Experiments," Technometrics, 39, 1, 52-62.
Box, G. E. P., and Draper, N. R., (1987), Empirical Model Building and Response Surfaces, John Wiley & Sons, New York, NY. Box, G. E. P., and Hunter, J. S., (1954), "A Confidence Region for the Solution of a Set of Simultaneous Equations with an Application to Experimental Design," Biometrika, 41, 190-199 Box, G. E. P., and Wilson, K. B., (1951), "On the Experimental Attainment of Optimum Conditions," Journal of the Royal Statistical Society, Series B, 13, 1-45.
Capobianco, T. E., Splett, J. D. and Iyer, H. K.,
"Eddy Current Probe Sensitivity as a Function of Coil Construction
Parameters." Research in Nondesructive Evaluation, Vol. 2,
pp. 169-186, December, 1990.
Cornell, J. A., (1990),
Experiments with Mixtures: Designs, Models, and the Analysis of
Mixture Data, John Wiley & Sons, New York, NY.
Del Castillo, E., (1996), "Multiresponse Optimization
Confidence Regions," Journal of Quality
Technology, 28, 1, 61-70.
Derringer, G., and Suich, R., (1980), "Simultaneous
Optimization of Several Response Variables," Journal of Quality
Technology, 12, 4, 214-219.
Draper, N.R., (1963), "Ridge Analysis of Response
Surfaces," Technometrics, 5, 469-479.
Hoerl, A. E., (1959), "Optimum Solution of Many
Variables Equations," Chemical Engineering Progress, 55, 67-78.
Hoerl, A. E., (1964), "Ridge Analysis," Chemical
Engineering Symposium Series, 60, 67-77.
Khuri, A. I., and Cornell, J. A., (1987),
Response Surfaces, Marcel Dekker, New York, NY.
Mee, R. W., and Peralta, M. (2000),
"Semifolding 2k-p Designs," Technometrics, 42, 2, p122.
Miller, A. (1997), "Strip-Plot Configuration
of Fractional Factorials," Technometrics, 39, 2, p153.
Myers, R. H., and Montgomery, D. C., (1995),
Response Surface Methodology: Process and Product Optimization
Using Designed Experiments, John Wiley & Sons, New York, NY.
Ryan, Thomas P., (2000),
Statistical Methods for Quality Improvement,
John Wiley & Sons, New York, NY.
Taguchi, G. and Konishi, S.,
(1987), Orthogonal Arrays and Linear Graphs, Dearborn, MI, ASI
press.
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Well Known General References |
Box, G. E. P., Hunter, W. G., and
Hunter, S. J. (1978), Statistics for Experimenters, John Wiley
& Sons, Inc., New York, NY.
Diamond, W. J., (1989), Practical Experimental Designs, Second Ed., Van Nostrand Reinhold, NY. John, P. W. M., (1971), Statistical Design and Analysis of Experiments, SIAM Classics in Applied Mathematics, Philadelphia, PA. Milliken, G. A., and Johnson, D. E., (1984), Analysis of Messy Data, Vol. 1, Van Nostrand Reinhold, NY. Montgomery, D. C., (2000), Design and Analysis of Experiments, Fifth Edition, John Wiley & Sons, New York, NY. |
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Case studies for different industries | Snee, R. D., Hare, L. B., and Trout, J. R.(1985), Experiments in Industry. Design, Analysis and Interpretation of Results, Milwaukee, WI, American Society for Quality. | ||
Case studies in Process Improvement, including DOE, in the Semiconductor Industry | Czitrom, V., and Spagon, P. D., (1997), Statistical Case Studies for Industrial process Improvement, Philadelphia, PA, ASA-SIAM Series on Statistics and Applied Probability. | ||
Software to design and analyze experiments | In addition to the extensive design and analysis documentation and routines in Dataplot, there are many other good commercial DOE packages. This Chapter showed examples using "JMP" (by the SAS Institute, 100 SAS CampusDrive, Cary, North Carolina 27513-9905), as an illustration of a good commercial package. |