2.
Measurement Process Characterization
2.2. Statistical control of a measurement process
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Emphasis on instruments | Short-term variability or instrument precision is controlled by monitoring standard deviations from repeated measurements on the instrument(s) of interest. The database can come from measurements on a single artifact or a representative set of artifacts. | ||
Artifacts - Case study: Resistivity |
The artifacts must be of the same type and geometry as items that
are measured in the workload, such as:
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Concepts covered in this section | The concepts that are covered in this section include: |