NIST StRD    Data Archive

Analysis of Variance



Background Information

Design: One-Way Balanced Model: y(ij) = mu + tau(i) + e(ij)


Dataset Name
    Level of
Difficulty
Constant
Leading
Digits
Replicates
per Cell
Number of
Treatments
Source

SiRstv  Lower 3        5       5              Observed
SmLs01  Lower 1        21       9              Generated
SmLs02  Lower 1        201       9              Generated
SmLs03  Lower 1        2001       9              Generated
AtmWtAg  Average 7        24       2              Observed
SmLs04  Average 7        21       9              Generated
SmLs05  Average 7        201       9              Generated
SmLs06  Average 7        2001       9              Generated
SmLs07  Higher 13        21       9              Generated
SmLs08  Higher 13        201       9              Generated
SmLs09  Higher 13        2001       9              Generated