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8. Assessing Product Reliability
8.4. Reliability Data Analysis

8.4.7.

References For Chapter 8: Assessing Product Reliability

Aitchison, J. and Brown, J. A. C.,(1957), The Log-normal distribution,  Cambridge University Press, New York and London. 

Ascher, H. (1981), "Weibull Distribution vs Weibull Process," Proceedings Annual Reliability and Maintainability Symposium, pp. 426-431. 

Ascher, H. and Feingold, H. (1984), Repairable Systems Reliability, Marcel  Dekker, Inc., New York. 

Bain, L.J. and Englehardt, M. (1991), Statistical Analysis of Reliability and Life-Testing Models: Theory and Methods, 2nd ed., Marcel Dekker, New York. 

Barlow, R. E. and Proschan, F. (1975), Statistical Theory of Reliability and Life Testing, Holt, Rinehart and Winston, New York. 

Birnbaum, Z.W., and Saunders, S.C. (1968), "A Probabilistic Interpretation of Miner's Rule," SIAM Journal of Applied Mathematics, Vol. 16, pp. 637-652. 

Birnbaum, Z.W., and Saunders, S.C. (1969), "A New Family of Life Distributions," Journal of Applied Probability, Vol. 6, pp. 319-327. 

Cox, D.R. and Lewis, P.A.W. (1966), The Statistical Analysis of Series of  Events, John  Wiley & Sons, Inc., New York. 

Cox, D.R. (1972), "Regression Models and Life Tables," Journal of the Royal Statistical Society, B 34, pp. 187-220. 

Cox, D. R., and Oakes, D. (1984), Analysis of Survival Data, Chapman and Hall,  London, New York. 

Crow,  L.H. (1974), "Reliability Analysis for Complex Repairable Systems", Reliability and Biometry, F. Proschan and R.J. Serfling, eds., SIAM, Philadelphia, pp 379- 410. 

Crow, L.H. (1975), "On Tracking Reliability Growth," Proceedings Annual Reliability and Maintainability Symposium, pp. 438-443. 

Crow,  L.H. (1982), "Confidence Interval Procedures for the Weibull Process With Applications to Reliability Growth," Technometrics,  24(1):67-72. 

Crow,  L.H. (1990), "Evaluating the Reliability of Repairable Systems," Proceedings  Annual Reliability and Maintainability Symposium, pp. 275-279. 

Crow,  L.H. (1993), "Confidence Intervals on the Reliability of Repairable Systems,"  Proceedings Annual Reliability and Maintainability Symposium, pp. 126-134 

Duane, J.T. (1964), "Learning Curve Approach to Reliability Monitoring," IEEE Transactions On Aerospace, 2, pp. 563-566. 

Gumbel, E. J. (1954), Statistical Theory of Extreme Values and Some Practical Applications, National Bureau of Standards Applied Mathematics Series 33, U.S. Government Printing Office, Washington, D.C. 

Hahn, G.J., and Shapiro, S.S. (1967), Statistical Models in Engineering, John Wiley & Sons, Inc., New York. 

Hoyland, A., and Rausand, M. (1994), System Reliability Theory, John Wiley & Sons, Inc., New York. 

Johnson, N.L., Kotz, S. and Balakrishnan, N. (1994), Continuous Univariate Distributions Volume 1, 2nd edition, John Wiley & Sons, Inc., New York. 

Johnson, N.L., Kotz, S. and Balakrishnan, N. (1995), Continuous Univariate Distributions Volume 2, 2nd edition, John Wiley & Sons, Inc., New York. 

Kaplan, E.L., and Meier, P. (1958), "Nonparametric Estimation From Incomplete Observations," Journal of the American Statistical Association, 53: 457-481. 

Kalbfleisch, J.D., and Prentice, R.L. (1980), The Statistical Analysis of Failure Data, John Wiley & Sons, Inc., New York. 

Kielpinski, T.J., and Nelson, W.(1975), "Optimum Accelerated Life-Tests for the Normal and Lognormal Life Distributins," IEEE Transactions on Reliability, Vol. R-24, 5, pp. 310-320. 

Klinger, D.J., Nakada, Y., and Menendez, M.A. (1990), AT&T Reliability Manual, Van Nostrand Reinhold, Inc, New York. 

Kolmogorov, A.N. (1941), "On A Logarithmic Normal Distribution Law Of The Dimensions Of Particles Under Pulverization," Dokl. Akad Nauk, USSR 31, 2, pp. 99-101. 

Kovalenko, I.N., Kuznetsov, N.Y., and Pegg, P.A. (1997), Mathematical Theory of Reliability of Time Dependent Systems with Practical Applications, John Wiley & Sons, Inc., New York. 

Landzberg, A.H., and Norris, K.C. (1969), "Reliability of Controlled Collapse Interconnections." IBM Journal Of Research and Development, Vol. 13, 3. 

Lawless, J.F. (1982), Statistical Models and Methods For Lifetime Data, John Wiley & Sons, Inc., New York. 

Leon, R. (1997-1999), JMP Statistical Tutorials on the Web at http://www.nist.gov/cgi-bin/exit_nist.cgi?url=http://web.utk.edu/~leon/jmp/.

Mann, N.R., Schafer, R.E. and Singpurwalla, N.D. (1974), Methods For Statistical Analysis Of Reliability & Life Data, John Wiley & Sons, Inc., New York. 

Martz, H.F., and Waller, R.A. (1982), Bayesian Reliability Analysis, Krieger Publishing Company, Malabar, Florida. 

Meeker, W.Q., and Escobar, L.A. (1998), Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York. 

Meeker, W.Q., and Hahn, G.J. (1985), "How to Plan an Accelerated Life Test - Some Practical Guidelines," ASC Basic References In Quality Control: Statistical Techniques - Vol. 10, ASQC , Milwaukee, Wisconsin. 

Meeker, W.Q., and Nelson, W. (1975), "Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions," IEEE Transactions on Reliability, Vol. R-24, 5, pp. 321-322. 

Michael, J.R., and Schucany, W.R. (1986), "Analysis of Data From Censored Samples," Goodness of Fit Techniques, ed. by D'Agostino, R.B., and Stephens, M.A., Marcel Dekker, New York. 

MIL-HDBK-189 (1981), Reliability Growth Management, U.S. Government Printing Office. 

MIL-HDBK-217F ((1986), Reliability Prediction of Electronic Equipment, U.S. Government Printing Office. 

MIL-STD-1635 (EC) (1978), Reliability Growth Testing, U.S. Government Printing Office. 

Nelson, W. (1990), Accelerated Testing, John Wiley & Sons, Inc., New York. 

Nelson, W. (1982), Applied Life Data Analysis, John Wiley & Sons, Inc., New York. 

O'Connor, P.D.T. (1991), Practical Reliability Engineering (Third Edition), John Wiley & Sons, Inc., New York. 

Peck, D., and Trapp, O.D. (1980), Accelerated Testing Handbook, Technology Associates and Bell Telephone Laboratories, Portola, Calif. 

Pore, M., and Tobias, P. (1998), "How Exact are 'Exact' Exponential System MTBF Confidence Bounds?", 1998 Proceedings of the Section on Physical and Engineering Sciences of the American Statistical Association

SEMI E10-0701, (2001), Standard For Definition and Measurement of Equipment Reliability, Availability and Maintainability (RAM), Semiconductor Equipment and Materials International,  Mountainview, CA. 

Tobias, P. A., and Trindade, D. C. (1995), Applied Reliability, 2nd edition, Chapman and Hall, London, New York. 
 

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